STEM image acquisition typically requires significantly more time compared to fixed-beam TEM imaging. Due to inherent system instabilities, such as sample drift, the resulting images may exhibit noticeable distortions. For example, round particles may appear slightly elliptical or rectangular lattice cells may exhibit monoclinic distortion. Fortunately, these distortions can be corrected post-acquisition.
To address STEM distortions, a solution involves capturing two STEM images of the same area with perpendicular scanning directions. The plugin offers various levels of undistorted image reconstruction. The basic version assumes linear drift during both acquisitions, while the advanced version tackles non-linear instabilities, essential for high-resolution STEM images.
Stand-alone tool to correct STEM distortions (Windows only, current version 1.0.1):
last updated 15.12.2024
Main Features:
>> Read DigitalMicrograph and TIA stored STEM images and correct them for STEM distortions. Important: the tool requires TWO STEM images taken one after another with changing the fast scan direction (rotate 90°) in between. Currently supported formats:
| Developer | Extension | Read | Write |
| Ametek (Gatan), 2D STEM images | dm3, dm4 | Yes | Yes |
| Thermofisher (FEI) TIA 2D STEM images | ser | Yes | No |
>> Allows for easy comparison of subsequently taken images and visual estimation of continuous drift during acquisition.
>> Calculates the drift based on analyzing both images and correct images for the drift-related distortions. As the fast-scan directions of images are mutually perpendicular, the majority of distortions are removed.
>> The current version assumes a linear drift. Evaluation of non-linear drift is under development.
temDM STEMCOR plugin for DigitalMicrograph
last updated 31.12.2021, version 1.82
If you download STEMCOR, it is strongly recommended to download also the STEM correction learning examples: