Spectrum-Imaging

The software available on this page specializes in the treatment of STEM (Scanning Transmission Electron Microscopy) data, specifically focusing on spectrum-imaging data using Multivariate Statistical Analysis (MSA), i.e. Principal Component Analysis (PCA).

Stand-alone tool for spectrum-images (Windows only, current version 1.5.1.2):

Main Features:

>> Read most common formats of spectrum-imaging and 4DSTEM and allows for data conversion. Currently supported formats:

DeveloperExtensionReadWrite
Ametek (Gatan), 3D, 4D STEMdm3,dm4YesYes
ThermoFisher 3D STEM (event-based) VeloxemdYesNo
ThermoFisher 4D STEM EMPADrawYesNo
Bruker 3D STEM (event-based)bcfYesNo
Jeol 3D STEM (event-based)ptsYesNo
Hyperspy 3D STEMhspyYesYes
Panta RheiprzYesYes
numpynpyYesYes
binaryrawYesNo
EMPAD 4DSTEMrawYesNo
Planned: EDAX, PantaRhei

>> Perform “silent” (no user interaction) PCA denoising of spectrum-images. An automatically determined number of principal components can be further changed manually with seeing immediately the result.

>> Allows for clustering data in the latent factor space with visualizing cluster spatial shapes and spectral signatures.

temDM MSA plugin for DigitalMicrograph

This DigitalMicrograph plugin enables Multivariate Statistical Analysis of STEM EELS or EDX data cubes. The plugin primarily focuses on Principal Component Analysis (PCA), which effectively extracts the components with the highest variance in the raw data. This process significantly reduces the data’s dimensionality and eliminates noise. To facilitate better interpretation, the obtained PCA components can be further refined using methods like Varimax or ICA to rotate them in the factor space. Additionally, the PCA results can be transformed into endmember spectra, which are easily interpretable. These spectra are derived by manipulating the data in the factor space. Moreover, for datasets with complex internal data distribution, the plugin provides the capability to cluster the data within the factor space.

last updated 3.08.2022, version 2.37

basic version

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advanced version

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Application examples of STEM data cubes:

Simulated Mg-Al-O

STEM EELS

Si-Ge layers (Mag*I*Cal)

STEM EELS

Si-Ge layers (Mag*I*Cal)

STEM EDX

CMOS device

STEM EDX

CMOS device

STEM EELS

Superalloy

STEM EDX